Speaker
Benjamin Weiser
Description
The assay of lead 210 was attempted using a novel method for Accelerated Mass Spectrometry. Using this technique we propose a method for Pb210 assay to which can be applied to most materials for impurity determination for many pressing radiation background investigations. Our method can uniquely eliminate molecular background drastically improving sensitivities while requiring far less than a gram of sample to be assayed making it advantageous over other assay techniques. Chemical procedure and AMS techniques were combined to observe Pb210 concentration never before seen in Kapton and the technique was compared and proved by the assay of Pb210 concentration in Sn-free solder.
